Automatic Test Equipment (ATE)

Analog Devices offers a comprehensive portfolio of automatic test equipment (ATE) focused products designed for high performance and cost-effective semiconductor testing. Integrated pin electronics (PE) drive digital signals with precise control of voltages and currents, and these PE products offer integrated per-pin parametric measurement units (PPMU) controlled via level-setting DACs. Device power supplies (DPS) are essential for providing precise power to devices under test. Parametric measurement units (PMU) are used for accurate measurement and monitoring of voltages and currents. ADI’s ATE solutions cater to a wide range of IC testing applications targeting both packaged and on wafer testing solutions. Typical devices under test include digital SoCs, memory products, RF devices, and high voltage devices. ADI’s ATE products deliver industry-leading performance with maximum flexibility to capture any ATE testing need.