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ADR435

PRODUCTION

Ultralow Noise XFET® Voltage References with Current Sink and Source Capability

Data Sheet (Rev. N)
Part Models
10
1ku List Price
Starting From $3.84
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Part Details

  • Low noise (0.1 Hz to 10.0 Hz): 3.5 μV p-p @ 2.500 V output
  • No external capacitor required
  • Low temperature coefficient
    • A Grade: 10 ppm/°C maximum
    • B Grade: 3 ppm/°C maximum
  • Load regulation: 15 ppm/mA
  • Line regulation: 20 ppm/V
  • Wide operating range
    • ADR435: 7.0 V to 18 V
  • High output source and sink current: 30 mA and −20 mA
  • Wide temperature range: −40°C to +125°C

ADR435-EP supports defense and aerospace applications (AQEC standard)

  • Download ADR431-EP/ADR434-EP/ADR435-EP data sheet (pdf)
  • Military temperature range (−55°C to +125°C)
  • Controlled manufacturing baseline
  • One assembly/test site
  • One fabrication site
  • Enhanced product change notification
  • Qualification data available on request
  • V62/11602 DSCC Drawing Number
ADR435
Ultralow Noise XFET® Voltage References with Current Sink and Source Capability
ADR430-431-433-434-435 Pin Configuration ADR430-431-433-434-435 Pin Configuration
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Documentation

Data Sheet 3

Application Note 3

Technical Articles 4

Frequently Asked Question 1

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Reference Designs

System Circuit Diagram of Low Power AD8641 Amplifier Driving the AD7988-1 ADC
System Circuit Diagram of Low Power AD8641 Amplifier Driving the AD7988-1 ADC
CN0306 Circuits from the lab

16-Bit, 100k SPS Low Power Data Acquisition System Optimized for Sub-Nyquist Input Signals Up to 1 kHz

View Detailed Reference Design

Features and Benefits

  • 16-bit 100kSPS SAR ADC system
  • Optimum low power drive amplifier
  • Input signals up to 1kHz
High Common-Mode Voltage Bidirectional Isolated Current Monitor
High Common-Mode Voltage Bidirectional Isolated Current Monitor
CN0240 Circuits from the lab

Bidirectional Isolated High-Side Current Sense with 270 V Common-Mode Rejection

View Detailed Reference Design

Features and Benefits

  • +/- 270 V common mode voltage
  • Creates isolated supply for digital control
  • 1% accuracy, bidirectional current monitor system
  • Galvanic isolation protects processor
Single-Ended-to-Differential ADC Driver
Single-Ended-to-Differential ADC Driver
CN0180 Circuits from the lab

Precision, Low Power, Single-Supply, Fully Integrated Differential ADC Driver for Industrial-Level Signals

View Detailed Reference Design

Features and Benefits

  • Industrial input voltage levels up to ±10V
  • Singled ended to differential interface to 18-bit SAR converter
  • Low power, total less than 22 mW
  • Single supply 5V rail
High Performance, 18-Bit ADC Front End
High Performance, 18-Bit ADC Front End
CN0261 Circuits from the lab

18-Bit, 250 kSPS Data Acquisition System Optimized for AC Performance

View Detailed Reference Design

Features and Benefits

  • 18-Bit, 250kSPS PulSAR ADC
  • Low Noise Driver
  • Greater than 100dB SNR @ 1kHz Input
  • Greater than 118dB THD @ 1kHz Input
Simplified Receiver Subsystem for Magnitude and Phase Measurements
Simplified Receiver Subsystem for Magnitude and Phase Measurements
CN0374 Circuits from the lab

RF-to-Bits Solution Offers Precise Phase and Magnitude Data to 6 GHz

View Detailed Reference Design

Features and Benefits

  • Precise Magnitude and Phase Measurements to 6GHz
  • Small PCB Footprint
CN0306
16-Bit, 100k SPS Low Power Data Acquisition System Optimized for Sub-Nyquist Input Signals Up to 1 kHz
System Circuit Diagram of Low Power AD8641 Amplifier Driving the AD7988-1 ADC
CN0240
Bidirectional Isolated High-Side Current Sense with 270 V Common-Mode Rejection
High Common-Mode Voltage Bidirectional Isolated Current Monitor
CN0180
Precision, Low Power, Single-Supply, Fully Integrated Differential ADC Driver for Industrial-Level Signals
Single-Ended-to-Differential ADC Driver
CN0261
18-Bit, 250 kSPS Data Acquisition System Optimized for AC Performance
High Performance, 18-Bit ADC Front End
CN0374
RF-to-Bits Solution Offers Precise Phase and Magnitude Data to 6 GHz
Simplified Receiver Subsystem for Magnitude and Phase Measurements

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